Căutare după Subiect "thin films"
Afișează articolele 1-2 of 2
-
Characterization of Materials Surface by X-Ray Reflectivity Measurements
(Universitatea ”Dunărea de Jos” din Galați, 2009)The mechanical or physical properties of surface determine a certain behaviour of material in various working conditions. For example, the roughness of surface influences the value of friction coefficient. X-ray reflectivity ... -
On the Kinetics of Sol Gel Al:ZnO thin Films Crystallization on Silicon Substrate
(Universitatea "Dunărea de Jos" din Galați, 2006)Recently, there is a growing interest in applying ZnO thin films on silicon buffer substrates for p-n junction devices, optical wave guide, etc. A sol gel process is very attractive technique for obtaining oxide thin ...
