Căutare 2008 fascicula8 după Autor "Ilie, Filip"
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Investigation of Layers Formed Through Selective Transfer with Atomic Force Microscopy
Ilie, Filip; Tița, Constantin (Universitatea ”Dunărea de Jos” din Galați, 2008)Atomic force microscopy (AFM) has become a versatile tool for investigating local mechanical properties. In addition, through the AFM tip-couple interaction, it is possible to study the effects of perturbations and ...