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High-Dielectric Inorganic-Organic Hybrid thin Films for fie;ld Effect Transistors (FETFT)
dc.contributor.author | Vâlcu (Herbei), Elena Emanuela | |
dc.contributor.author | Mușat, Viorica | |
dc.contributor.author | Oertel, Susanne | |
dc.contributor.author | Jank, Michael | |
dc.date.accessioned | 2018-08-29T07:50:02Z | |
dc.date.available | 2018-08-29T07:50:02Z | |
dc.date.issued | 2013 | |
dc.identifier.issn | 1453 – 083X | |
dc.identifier.uri | http://10.11.10.50/xmlui/handle/123456789/5347 | |
dc.description | The Annals of "Dunarea de Jos" University of Galati Fascicle IX Metallurgy and Materials Science N0. 2 – 2013, ISSN 1453 – 083X | ro_RO |
dc.description.abstract | The paper discusses the challenges to develop thin films transistors for flexible transparent electronics, displays etc. The sol-gel preparation of hybrid thin films based on dielectric oxides nanoparticles (SiO2 NPs, ZrO2 NPs) and polymethy methacrylate (PMMA) is presented. The high-k hybrid thin films, evaluated as gate dielectric in a MIM structures, were deposed by spin-coating teqhnique. The multilayers (thin films) configuration of MIM structures were investigated by scanning electron microscopy (SEM) and electrical properties. The I-V and C-V curves showed a better dielectric behavior of hybrid films with respect to the simple PMMA films. Dielectric constant values of 2.1, 3.4 and 5.4 have been obtained for PMMA, ZrO2-PMMA and SiO2-PMMA films, respectively. | ro_RO |
dc.language.iso | en | ro_RO |
dc.publisher | Universitatea "Dunărea de Jos" din Galați | ro_RO |
dc.subject | hybrid dielectric materials | ro_RO |
dc.subject | thin film transistors | ro_RO |
dc.subject | morphology | ro_RO |
dc.subject | I-V and C-V measurements | ro_RO |
dc.title | High-Dielectric Inorganic-Organic Hybrid thin Films for fie;ld Effect Transistors (FETFT) | ro_RO |
dc.type | Article | ro_RO |
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2013 fascicula9 nr2 [14]