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dc.contributor.authorMușat, Viorica
dc.contributor.authorCanejo, Joan
dc.contributor.authorIticescu, Cătălina
dc.date.accessioned2018-10-22T08:55:29Z
dc.date.available2018-10-22T08:55:29Z
dc.date.issued2006
dc.identifier.issn1453 – 083X
dc.identifier.urihttp://10.11.10.50/xmlui/handle/123456789/5516
dc.descriptionThe Annals of "Dunarea de Jos" University of Galati Fascicle IX Metallurgy and Materials Science ISSN 1453 – 083X. NR 2 – 2006ro_RO
dc.description.abstractRecently, there is a growing interest in applying ZnO thin films on silicon buffer substrates for p-n junction devices, optical wave guide, etc. A sol gel process is very attractive technique for obtaining oxide thin films, due to easy control of film composition, easy fabrication of large area thin films with low cost and the ability to coat-specific shapes substrates. This paper presents a kinetic investigation of the crystallization (550-650oC) of high preferential c-axis oriented ZnO thin films on p-type (100) silicon wafer substrate, from XRD data.ro_RO
dc.language.isoenro_RO
dc.publisherUniversitatea "Dunărea de Jos" din Galațiro_RO
dc.subjectAl-doped ZnOro_RO
dc.subjectthin filmsro_RO
dc.subjectsol-gelro_RO
dc.subjectX-ray diffractionro_RO
dc.subjectatomic force microscopyro_RO
dc.subjectkinetic curvesro_RO
dc.titleOn the Kinetics of Sol Gel Al:ZnO thin Films Crystallization on Silicon Substratero_RO
dc.typeArticlero_RO


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