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On the Kinetics of Sol Gel Al:ZnO thin Films Crystallization on Silicon Substrate
dc.contributor.author | Mușat, Viorica | |
dc.contributor.author | Canejo, Joan | |
dc.contributor.author | Iticescu, Cătălina | |
dc.date.accessioned | 2018-10-22T08:55:29Z | |
dc.date.available | 2018-10-22T08:55:29Z | |
dc.date.issued | 2006 | |
dc.identifier.issn | 1453 – 083X | |
dc.identifier.uri | http://10.11.10.50/xmlui/handle/123456789/5516 | |
dc.description | The Annals of "Dunarea de Jos" University of Galati Fascicle IX Metallurgy and Materials Science ISSN 1453 – 083X. NR 2 – 2006 | ro_RO |
dc.description.abstract | Recently, there is a growing interest in applying ZnO thin films on silicon buffer substrates for p-n junction devices, optical wave guide, etc. A sol gel process is very attractive technique for obtaining oxide thin films, due to easy control of film composition, easy fabrication of large area thin films with low cost and the ability to coat-specific shapes substrates. This paper presents a kinetic investigation of the crystallization (550-650oC) of high preferential c-axis oriented ZnO thin films on p-type (100) silicon wafer substrate, from XRD data. | ro_RO |
dc.language.iso | en | ro_RO |
dc.publisher | Universitatea "Dunărea de Jos" din Galați | ro_RO |
dc.subject | Al-doped ZnO | ro_RO |
dc.subject | thin films | ro_RO |
dc.subject | sol-gel | ro_RO |
dc.subject | X-ray diffraction | ro_RO |
dc.subject | atomic force microscopy | ro_RO |
dc.subject | kinetic curves | ro_RO |
dc.title | On the Kinetics of Sol Gel Al:ZnO thin Films Crystallization on Silicon Substrate | ro_RO |
dc.type | Article | ro_RO |
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2006 fascicula9 nr2 [26]