Browsing 2013 fascicula9 nr3 by Subject "diffractometer analysis"
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Characterization of Sintered Hardmetals Coated with Tic
(Universitatea "Dunărea de Jos" din Galaţi, 2013)This paper presents the realization of TiC thin films by CVD method. The thin layers of TiC thicknesses were 8 and 10μm, their thickness increasing with time, keeping the temperature. Diffractometer analysis certifies ...

